![Zaawansowane analizy statystyczne w ZEISS PiWeb]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.33.file/piweb-powerful-statistics.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.120.file/piweb-powerful-statistics.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.256.file/piweb-powerful-statistics.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.341.file/piweb-powerful-statistics.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.427.file/piweb-powerful-statistics.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.480.file/piweb-powerful-statistics.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb-powerful-statistics.jpg/_jcr_content/renditions/original./piweb-powerful-statistics.jpg"} "Zaawansowane analizy statystyczne w ZEISS PiWeb")
Zaawansowane analizy statystyczne w ZEISS PiWeb
Łatwe tworzenie zaawansowanych statystyk
![Badania GR&R]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_powerful-statistics.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_powerful-statistics.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_powerful-statistics.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_powerful-statistics.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_powerful-statistics.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_powerful-statistics.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_powerful-statistics.jpg/_jcr_content/renditions/original./piweb_powerful-statistics.jpg"} "Badania GR&R")
Badania GR&R
![Wykresy kontrolne]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_control-chart.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_control-chart.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_control-chart.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_control-chart.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_control-chart.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_control-chart.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_control-chart.jpg/_jcr_content/renditions/original./piweb_control-chart.jpg"} "Wykresy kontrolne")
Wykresy kontrolne
Oceniaj dane procesowe za pomocą wbudowanych wykresów dla x̅, S (odchylenie standardowe) i R (zakres).
![Badania zdolności]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.27,21,1863,1055.file/piweb_capability-studies.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.27,21,1863,1055.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.27,21,1863,1055.file/piweb_capability-studies.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.27,21,1863,1055.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.27,21,1863,1055.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.27,21,1863,1055.file/piweb_capability-studies.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1836.1033.27,21,1863,1055.file/piweb_capability-studies.jpg"} "Badania zdolności")
![Badania zdolności]({"xsmall":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.100.56.file/piweb_capability-studies.jpg","small":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.360.203.file/piweb_capability-studies.jpg","medium":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.768.432.file/piweb_capability-studies.jpg","large":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1024.576.file/piweb_capability-studies.jpg","xlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1280.720.file/piweb_capability-studies.jpg","xxlarge":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original.image_file.1440.810.file/piweb_capability-studies.jpg","max":"https://www.zeiss.pl/content/dam/iqs/r/software/zeiss-piweb/powerful-statistics/piweb_capability-studies.jpg/_jcr_content/renditions/original./piweb_capability-studies.jpg"} "Badania zdolności")
Badania zdolności
Wykonuj szeroki zakres badań zdolności procesu, w tym Cm, Cmk, Cp, Cpk, Po, Pok itp.
Więcej narzędzi
Twórz raporty zawierające inne przydatne narzędzia, takie jak wykresy pudełkowe, histogramy, linie trendu i wykresy słupkowe.