Uniwersalny mikroskop elektronowy łączący jakość danych z intuicyjną obsługą
Systemy z rodziny ZEISS EVO łączą wysokowydajną skaningową mikroskopię elektronową z intuicyjnym, przyjaznym dla użytkownika środowiskiem, które przypada do gustu zarówno ekspertom, jak i początkującym w dziedzinie. Dzięki kompleksowemu zakresowi dostępnych opcji, ZEISS EVO można dostosować dokładnie do Twoich wymagań – niezależnie od tego, czy zajmujesz się badaniami materiałowymi, czy rutynowym zapewnieniem jakości przemysłowej i analizą wad.
Wszechstronne, wielofunkcyjne rozwiązanie
Najlepsza użyteczność w swojej klasie
Doskonała jakość obrazu
Automatyzacja przepływu pracy i integralność danych
ZEISS EVO to konwencjonalny system klasy entry-level z żarnikiem wolframowym lub LaB6, do codziennych powtarzalnych zadań obrazowania, np. analizy materiałów o wysokiej rozdzielczości, z w dużej mierze zautomatyzowanymi i wspomagającymi procesami. System pozwala na elastyczność przy mniej wymagających rozmiarach struktur.
Obszary zastosowań
Analiza jakości i kontrola jakości
Analiza uszkodzeń i fraktografia
Materiałografia
Analiza morfologiczna i chemiczna cząstek w celu spełnienia norm ISO 16232 i VDA 19 część 1 i 2
Analiza wtrąceń niemetalicznych
ZEISS EVO: Uniwersalny mikroskop elektronowy łączący jakość danych z intuicyjną obsługą
Przenieś swoją inspekcję na wyższy poziom. ZEISS EVO oferuje menu opcji konfiguracji, aby spełnić Twoje dokładne wymagania cenowe i wydajnościowe. Dopasuj żądaną rozdzielczość do swojej aplikacji i wybierz jeden z trzech rozmiarów komory.
Możesz również zdecydować się na wysoką próżnię, zmienne ciśnienie lub ciśnienie otoczenia, dopasowując je do rodzaju próbki. Następnie wybierz spośród detektorów SE, BSE, EDX, VP i C2D, odpowiednio do zastosowania. Dzięki ZEISS EVO możesz cieszyć się korzyściami mikroskopii elektronowej w przystępnej cenie.
Przykłady zastosowań
Elektronika
Na powierzchni układu scalonego widoczne są ciała obce i zanieczyszczenia. Obraz uzyskano za pomocą detektora SE w wysokiej próżni przy napięciu 10 kV.
Ogniwa paliwowe
Ogniwa paliwowe zazwyczaj składają się z membran polimerowo-elektrolitowych umieszczonych pomiędzy elektrodami platynowymi. Te krytyczne komponenty muszą być obrazowane przy niskich napięciach, aby zapewnić uzyskanie szczegółowych informacji o powierzchni w wysokiej rozdzielczości. Przekrój poprzeczny ze źródłem LaB6 (po lewej) i źródłem wolframowym (po prawej) przy 3 kV. Źródło LaB6 zapewnia więcej szczegółów powierzchni przy niskich napięciach przyspieszających.
Ocynkowana stal miękka
Przekrój ocynkowanej stali miękkiej, obrazowany za pomocą detektora SE na aparacie ZEISS EVO 15. Po lewej: żywica montażowa; środek: warstwa cynku; po prawej: stal miękka.
Analiza materiałów za pomocą spektroskopii rentgenowskiej (EDX)
Obrazy BSE reprezentatywnych skorodowanych powierzchni z mapą EDS: chrom, ołów, miedź, nikiel, karbon i tlen.
Analiza uszkodzeń na powierzchni łożyska kulkowego
Powierzchnia łożyska kulkowego zobrazowana detektorem BSE ujawnia pęknięcia i łuszczenie się struktury powierzchni.
Czystość techniczna
Cząstka z filtra cząstek: analiza czystości technicznej i kontrola jakości.
Skaningowy mikroskop elektronowy ZEISS EVO – 10 najważniejszych funkcji w 90 sekund
Zablokowana zawartość stron trzecich
Odtwarzacz wideo został zablokowany w związku z Twoimi preferencjami śledzenia. Aby zmienić ustawienia i odtworzyć wideo, kliknij poniższy przycisk i wyraź zgodę na użycie „funkcjonalnych” technologii śledzenia.
Dowiedz się, w jaki sposób skaningowy mikroskop elektronowy ZEISS EVO wspomaga rutynowe zadania związane z kontrolą jakości i analizą błędów w laboratoriach kontroli jakości i materiałów, umożliwiając intuicyjne obrazowanie nawet początkującym użytkownikom. EVO w skrócie: - Obrazowanie o wysokiej rozdzielczości - Wydajna praca - Analiza składu chemicznego - Duże części - Akwizycja obrazu z dużego obszaru - Próbki nieprzewodzące - Analiza cząstek EDX - Pomiary automatyczne - Inteligentna segmentacja obrazu - Korelacja i udostępnianie obrazu
Inne zastosowania w przemyśle:
Analiza faz, cząstek i spoin
Wizualna kontrola podzespołów elektronicznych, układów scalonych, urządzeń MEMS i ogniw słonecznych
Badanie powierzchni i struktury krystalicznej drutu miedzianego
Badanie korozji metali
Analiza faz międzymetalicznych i przemian fazowych
Obrazowanie i analiza mikropęknięć i wytrzymałości na pękanie
Badania powłok i materiałów kompozytowych
Badanie szwów spawalniczych i stref wpływu ciepła
Dzięki ZEISS EVO znaleźliśmy igłę w stogu siana.
Jak znaleźć igłę w stogu siana?
Czystość techniczna: Grupa INNIO analizuje skład chemiczny cząstek zanieczyszczeń przy użyciu rozwiązania ZEISS.
Zablokowana zawartość stron trzecich
Odtwarzacz wideo został zablokowany w związku z Twoimi preferencjami śledzenia. Aby zmienić ustawienia i odtworzyć wideo, kliknij poniższy przycisk i wyraź zgodę na użycie „funkcjonalnych” technologii śledzenia.
Dokładne, wiarygodne wyniki są oczywiście ważne, ale ważne jest również ich szybkie uzyskanie.
Zastosowania mikroskopii w zapewnianiu jakości:
Przykłady wdrożeń i broszura o przemyśle dla przemysłu
ZEISS IQS, Mic and TCA, Success Story, INNIO Group, EN, PDF
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